Speckle interferometry: optoelectronic developments and applications

Ralph P. Tatam

doi:10.1117/12.357769

17 August 1999 Speckle interferometry: optoelectronic developments and applications

Ralph P. Tatam

Author Affiliations +

Proceedings Volume 3745, Interferometry '99: Applications; (1999) https://doi.org/10.1117/12.357769
Event: International Conference on Optical Metrology, 1999, Pultusk Castle, Poland

Abstract

Since the initial concept of speckle interferometry was published more than 30 years ago the subject has matured to the point where it is now an engineering tool used in a wide range of applications with instrumentation available from a number of companies. The development of the technique to this level has been accomplished by making use of parallel developments in a range of technological areas. These are the laser, the PC, and the CCD camera. More recently the incorporation of optical fiber technology has also had a major impact. This paper reviews recent developments in the optoelectronic technology used in speckle interferometry instrumentation and the use made of it in a range of application areas.

Citation Download Citation

Ralph P. Tatam "Speckle interferometry: optoelectronic developments and applications", Proc. SPIE 3745, Interferometry '99: Applications, (17 August 1999); https://doi.org/10.1117/12.357769

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