Paper
19 July 1999 Real-time interferometric measurement of differential refractive index in low-concentration solutions
Jose E. Calatroni, Carmen Sainz, Antonio L. Guerrero, Rafael A. Escalona Z.
Author Affiliations +
Proceedings Volume 3749, 18th Congress of the International Commission for Optics; (1999) https://doi.org/10.1117/12.354892
Event: ICO XVIII 18th Congress of the International Commission for Optics, 1999, San Francisco, CA, United States
Abstract
Spectrally Resolved White Light Interferometry is used for real-time high-precision measurement of differential refractive index of low concentration solutions. Dispersion behavior of low concentration solutions is similar to that of their solvents, so that the differential refractive index is non-dispersive. White light provides redundant information which yields high precision results. Moreover, white light provides information about the absolute fringes' order, which allows to improve precision.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jose E. Calatroni, Carmen Sainz, Antonio L. Guerrero, and Rafael A. Escalona Z. "Real-time interferometric measurement of differential refractive index in low-concentration solutions", Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); https://doi.org/10.1117/12.354892
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KEYWORDS
Refractive index

Interferometers

Interferometry

Optical interferometry

Charge-coupled devices

Data processing

Liquids

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