Comparative characterization of highly oriented pyrolytic graphite by means of diffraction topography

Alessandra Tuffanelli; Manuel Sanchez del Rio; Giovanni Pareschi; Mauro Gambaccini; Angelo Taibi; Alessia Fantini; M. Ohler

doi:10.1117/12.370091

16 November 1999 Comparative characterization of highly oriented pyrolytic graphite by means of diffraction topography

Alessandra Tuffanelli, Manuel Sanchez del Rio, Giovanni Pareschi, Mauro Gambaccini, Angelo Taibi, Alessia Fantini, M. Ohler

Author Affiliations +

Proceedings Volume 3773, X-Ray Optics Design, Performance, and Applications; (1999) https://doi.org/10.1117/12.370091
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

Highly Oriented Pyrolytic Graphite is a very efficient and well-known x-ray and neutron monochromator. The crystal macroscopic properties are determined by its microscopic structure. Our aim is to study the crystal internal structure and correlate it with the crystal optical behavior. We studied the texture of the crystal, in particular its spatial homogeneity, for different samples using x-ray diffraction topography. The experiment was performed at the ESRF beamline BM5 using a laminar 18 keV monochromatic beam. Several samples supplied by different manufacturers have been studied. Images of (002) reflected beam have been acquired at the Bragg angle for each sample, using a phosphor coated CCD digital detector. Contrast profiles have been obtained, and exponential fits has been performed allowing to deduce the secondary extinction coefficient. It has been found that some samples are quite perfect and the results agree with ideally imperfect crystals model. Other samples present well defined granular macrostructures (with dimensions of tens of microns) superposed to the well-known Gaussian-like crystallite distribution. The different behavior between different samples should be explained in terms of sample internal structure, which is also related to the different graphitization process used by manufacturers.

Citation Download Citation

Alessandra Tuffanelli, Manuel Sanchez del Rio, Giovanni Pareschi, Mauro Gambaccini, Angelo Taibi, Alessia Fantini, and M. Ohler "Comparative characterization of highly oriented pyrolytic graphite by means of diffraction topography", Proc. SPIE 3773, X-Ray Optics Design, Performance, and Applications, (16 November 1999); https://doi.org/10.1117/12.370091

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