Long trace profiler survey results

Steven C. Irick

doi:10.1117/12.369237

11 November 1999 Long trace profiler survey results

Steven C. Irick

Proceedings Volume 3782, Optical Manufacturing and Testing III; (1999) https://doi.org/10.1117/12.369237
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

Today the Long Trace Profiler (LTP) is widely accepted as a viable way to measure X-ray mirrors, and at some institutions is the only instrument available for measuring long, high- curvature aspheres. Although some questions of absolute accuracy over the entire LTP measurement range remain unanswered, a comparison of LTPs can still be made to assess measurement variation. Recently a round robin survey of some LTPs within the United States has been made using a single set of mirrors. These mirrors were used to characterize the performance of an LTP over its advertised range of operation. The results of this survey are presented here.

Citation Download Citation

Steven C. Irick "Long trace profiler survey results", Proc. SPIE 3782, Optical Manufacturing and Testing III, (11 November 1999); https://doi.org/10.1117/12.369237

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