Dynamic displacement measurements with submicron resolution using microwave subcarrier interferometry

Alan Johnstone; Sebastian Portou; S. Gareth Pierce; Brian Culshaw

doi:10.1117/12.372948

9 December 1999 Dynamic displacement measurements with submicron resolution using microwave subcarrier interferometry

Alan Johnstone, Sebastian Portou, S. Gareth Pierce, Brian Culshaw

Proceedings Volume 3860, Fiber Optic Sensor Technology and Applications; (1999) https://doi.org/10.1117/12.372948
Event: Photonics East '99, 1999, Boston, MA, United States

Abstract

We have interrogated a commercially available (SOFO) fiber optic displacement sensor in a dynamic mode using microwave sub-carrier interferometry. The detection threshold is in the region of 50 nm and the linear dynamic range extends to several centimeters using a sub-carrier frequency around 900 MHz.

Citation Download Citation

Alan Johnstone, Sebastian Portou, S. Gareth Pierce, and Brian Culshaw "Dynamic displacement measurements with submicron resolution using microwave subcarrier interferometry", Proc. SPIE 3860, Fiber Optic Sensor Technology and Applications, (9 December 1999); https://doi.org/10.1117/12.372948

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