Paper
12 November 1999 Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope
Chi Wen Yang, Din Ping Tsai, Howard E. Jackson
Author Affiliations +
Proceedings Volume 3896, Design, Fabrication, and Characterization of Photonic Devices; (1999) https://doi.org/10.1117/12.370327
Event: International Symposium on Photonics and Applications, 1999, Singapore, Singapore
Abstract
Imaging the local evanescent intensity gradients by using a tapping-mode near-field scanning optical microscope is developed. Two different optical structures, one a well- characterized BK-7 glass prism in the total internal reflection configuration, and the other a side-polished optical fiber waveguide with a step index of refraction, were studied. Results show distinct imaging contrast of the intensity gradients, the reveal the variations of the local index of refraction of waveguide. This is a novel near-field optical method, and can be used in the imaging of local index of refraction of a variety of optical waveguide structures.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chi Wen Yang, Din Ping Tsai, and Howard E. Jackson "Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope", Proc. SPIE 3896, Design, Fabrication, and Characterization of Photonic Devices, (12 November 1999); https://doi.org/10.1117/12.370327
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Near field scanning optical microscopy

Waveguides

Near field optics

Refraction

Prisms

Near field

Optical fibers

Back to Top