Pulsed top-hat beam thermal lens: a simple and sensitive tool for in-situ measurement on ultraviolet dielectric components

Bincheng Li; Sven Martin; Eberhard Welsch; Roland Thielsch; Joerg Heber; Norbert Kaiser

doi:10.1117/12.379313

3 March 2000 Pulsed top-hat beam thermal lens: a simple and sensitive tool for in-situ measurement on ultraviolet dielectric components

Bincheng Li, Sven Martin, Eberhard Welsch, Roland Thielsch, Joerg Heber, Norbert Kaiser

Author Affiliations +

Proceedings Volume 3902, Laser-Induced Damage in Optical Materials: 1999; (2000) https://doi.org/10.1117/12.379313
Event: Laser-Induced Damage in Optical Materials: 1999, 1999, Boulder, CO, United States

Abstract

A mode-mismatched surface thermal lens technique with pulsed top-hat beam excitation and near field detection scheme is developed to measure in situ the thermoelastic response of UV dielectric coatings and bulk materials under excimer laser irradiation. The thermal lens technique is demonstrated to be not only convenient for an accurate determination of the laser-induced damage threshold (LIDT), but also sensitive to measure the thermoelastic response of dielectric coatings irradiated with fluences much below the LIDT, and hence, to carry out time resolved predamage investigation. The minimum detectable surface displacement of approximately 0.002nm is achieved with a simple experimental configuration. Nonlinear absorption of UV dielectric materials and coatings are demonstrated. The surface thermal lens technique is also a convenient technique to distinguish different damage mechanisms: thermal stress induced damage or melting induced damage, depending on the thermo-elastic properties of the substrate. Hence, this technique allows to indicate qualitatively the relative contribution of linear and nonlinear absorption as possible causes for laser damage. Moreover, the nonlinear effect in laser conditioning of a LaF₃/MgF₂ highly reflective dielectric coating has been observed experimentally.

Citation Download Citation

Bincheng Li, Sven Martin, Eberhard Welsch, Roland Thielsch, Joerg Heber, and Norbert Kaiser "Pulsed top-hat beam thermal lens: a simple and sensitive tool for in-situ measurement on ultraviolet dielectric components", Proc. SPIE 3902, Laser-Induced Damage in Optical Materials: 1999, (3 March 2000); https://doi.org/10.1117/12.379313

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available