Paper
25 April 2000 Experimental evaluation of a-Se and CdTe flat-panel x-ray detectors for digital radiography and fluoroscopy
Susumu Adachi, Naoyuki Hori, Kenji Sato, Satoshi Tokuda, Toshiyuki Sato, Kazuhiro Uehara, Yoshihiro Izumi, Hisashi Nagata, Youji Yoshimura, Satoshi Yamada
Author Affiliations +
Abstract
Described are two types of direct-detection flat-panel X-ray detectors utilizing amorphous selenium (a-Se) and cadmium telluride (CdTe). The a-Se detector is fabricated using direct deposition onto a thin film transistor (TFT) substrate, whereas the CdTe detector is fabricated using a novel hybrid method, in which CdTe is pre-deposited onto a glass substrate and then connected to a TFT substrate. The detector array format is 512 X 512 with a pixel pitch of 150 micrometer. The imaging properties of both detectors have been evaluated with respect to X-ray sensitivity, lag, spatial resolution, and detective quantum efficiency (DQE). The modulation transfer functions (MTFs) measured at 1 lp/mm were 0.96 for a- Se and 0.65 for CdTe. The imaging lags after 33 ms were about 4% for a-Se and 22% for CdTe. The DQE values measured at zero spatial frequency were 0.75 for a-Se and 0.22 for CdTe. The results indicate that the a-Se and CdTe detectors have high potential as new digital X-ray imaging devices for both radiography and fluoroscopy.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Susumu Adachi, Naoyuki Hori, Kenji Sato, Satoshi Tokuda, Toshiyuki Sato, Kazuhiro Uehara, Yoshihiro Izumi, Hisashi Nagata, Youji Yoshimura, and Satoshi Yamada "Experimental evaluation of a-Se and CdTe flat-panel x-ray detectors for digital radiography and fluoroscopy", Proc. SPIE 3977, Medical Imaging 2000: Physics of Medical Imaging, (25 April 2000); https://doi.org/10.1117/12.384511
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KEYWORDS
Sensors

Modulation transfer functions

X-rays

X-ray detectors

Spatial resolution

Electrodes

Radiography

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