EEV CCD39 wavefront sensor cameras for AO and interferometry

Raymond C. DuVarney; Charles A. Bleau; Garry T. Motter; Stuart B. Shaklan; Andreas C. Kuhnert; Gary L. Brack; Dean L. Palmer; Mitchell Troy; Thangh Kieu; Richard G. Dekany

doi:10.1117/12.390324

7 July 2000 EEV CCD39 wavefront sensor cameras for AO and interferometry

Raymond C. DuVarney, Charles A. Bleau, Garry T. Motter, Stuart B. Shaklan, Andreas C. Kuhnert, Gary L. Brack, Dean L. Palmer, Mitchell Troy, Thangh Kieu, Richard G. Dekany

Author Affiliations +

Proceedings Volume 4007, Adaptive Optical Systems Technology; (2000) https://doi.org/10.1117/12.390324
Event: Astronomical Telescopes and Instrumentation, 2000, Munich, Germany

Abstract

SciMeasure, in collaboration with Emory University and the Jet Propulsion Laboratory (JPL), has developed an extremely versatile CCD controller for use in adaptive optics, optical interferometry, and other applications requiring high-speed readout rates and/or low read noise. The overall architecture of this controller system will be discussed and its performance using both EEV CCD39 and MIT/LL CCID-19 detectors will be presented. Initially developed for adaptive optics applications, this controller is used in the Palomar Adaptive Optics program (PALAO), the AO system developed by JPL for the 200' Hale telescope at Palomar Mountain. An overview of the PALAO system is discussed and diffraction-limited science results will be shown. Recently modified under NASA SBIR Phase II funding for use in the Space Interferometry Mission testbeds, this controller is currently in use on the Micro- Arcsecond Metrology testbed at JPL. Details of a new vacuum- compatible remote CCD enclosure and specialized readout sequence programming will also be presented.

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Raymond C. DuVarney, Charles A. Bleau, Garry T. Motter, Stuart B. Shaklan, Andreas C. Kuhnert, Gary L. Brack, Dean L. Palmer, Mitchell Troy, Thangh Kieu, and Richard G. Dekany "EEV CCD39 wavefront sensor cameras for AO and interferometry", Proc. SPIE 4007, Adaptive Optical Systems Technology, (7 July 2000); https://doi.org/10.1117/12.390324

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