Paper
11 August 2000 Automatic mesh adaptivity for finite element simulation of multilayer MEMS
Jens Mueller, Jan G. Korvink
Author Affiliations +
Proceedings Volume 4175, Materials and Device Characterization in Micromachining III; (2000) https://doi.org/10.1117/12.395615
Event: Micromachining and Microfabrication, 2000, Santa Clara, CA, United States
Abstract
We have produced an automatic method with which to simulate the structural response of prestressed multi-layer plate and beam micro- structures accurately and reliably. The method relives the microsystem designer of the burden of finite element mesh design by performing local mesh refinement. A coarse mesh is iteratively refined according to an error that is computed directly from the finite element solution. The refinement strategy covers locally prestressed regions, plate composition inhomogeneities, and singular loads, yielding an optimized mesh and a highly accurate computed deformation.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jens Mueller and Jan G. Korvink "Automatic mesh adaptivity for finite element simulation of multilayer MEMS", Proc. SPIE 4175, Materials and Device Characterization in Micromachining III, (11 August 2000); https://doi.org/10.1117/12.395615
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Chemical elements

Error analysis

Microelectromechanical systems

Computer aided design

Microsystems

3D modeling

Atomic force microscope

Back to Top