Application of wavelet de-noise in digital speckle correlation method

Xuefeng Yao; Guan-chang Jin; Wu Zhen

doi:10.1117/12.402643

9 October 2000 Application of wavelet de-noise in digital speckle correlation method

Xuefeng Yao, Guan-chang Jin, Wu Zhen

Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000) https://doi.org/10.1117/12.402643
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China

Abstract

De-noise effects of wavelet analysis technique on Digital speckle correlation method (DSCM) are described in this paper. The principle of wavelet de-noise in digital speckle correlation is shown and the related algorithm structure is given. A series of DSCM experimental results, such as zero displacement, rigid body movement and 3-point-bending deformation, are handled. These results reveal that Wavelet analysis technique has better de- noise effect in the DSCM and the measure precision can reach to 0.01-0.005 pixel. This advanced DSCM provides a precision deformation measurement tool in optical metrology.

Citation Download Citation

Xuefeng Yao, Guan-chang Jin, and Wu Zhen "Application of wavelet de-noise in digital speckle correlation method", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); https://doi.org/10.1117/12.402643

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