Paper
6 October 2000 Relationship between inside defects and optical properties of CVDZnS
Huaizhi Yu, Ruifeng Song, Chengsong Huo, Jianping Liu, Wancai Huang, Hongchun Shi
Author Affiliations +
Proceedings Volume 4231, Advanced Optical Manufacturing and Testing Technology 2000; (2000) https://doi.org/10.1117/12.402804
Event: International Topical Symposium on Advanced Optical Manufacturing and Testing Technology, 2000, Chengdu, China
Abstract
Experiment methods such as X-ray diffraction, ICP-AES, TEM are adopted to study the relationship between optical properties and inside defects of CVDZnS samples which deposit at different experiment conditions. Through our studies, we draw the conclusion that there inside the material exists a kind of Zn-H associated particle which functioned as optical scatter centers. These scatter centers will lower the transmittance of CVDZnS both in the visible and the IR spectral regions. However, these Zn-H associated particles can be diminished through Hot Isostatic Pressing processing, and after the processing the transmittance of ZnS will substantially improved, especially in the visible spectral region.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huaizhi Yu, Ruifeng Song, Chengsong Huo, Jianping Liu, Wancai Huang, and Hongchun Shi "Relationship between inside defects and optical properties of CVDZnS", Proc. SPIE 4231, Advanced Optical Manufacturing and Testing Technology 2000, (6 October 2000); https://doi.org/10.1117/12.402804
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Cited by 4 scholarly publications.
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KEYWORDS
Zinc

Optical properties

Particles

Visible radiation

Transmittance

Hydrogen

Absorption

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