Influence of substrate orientation on the characteristics of Sr-ferrite thin films obtained by pulsed laser deposition

Mihaela E. Koleva; Rumen I. Tomov; S. Zotova; Peter A. Atanasov; Carmen Ristoscu; V. D. Nelea; Simona Arens; Eniko Gyorgy; Ion N. Mihailescu; Silviu Colis

doi:10.1117/12.425155

9 April 2001 Influence of substrate orientation on the characteristics of Sr-ferrite thin films obtained by pulsed laser deposition

Mihaela E. Koleva, Rumen I. Tomov, S. Zotova, Peter A. Atanasov, Carmen Ristoscu, V. D. Nelea, Simona Arens, Eniko Gyorgy, Ion N. Mihailescu, Silviu Colis

Author Affiliations +

Proceedings Volume 4397, 11th International School on Quantum Electronics: Laser Physics and Applications; (2001) https://doi.org/10.1117/12.425155
Event: 11th International School on Quantum Electronics: Laser Physics and Applications, 2000, Varna, Bulgaria

Abstract

We investigated the effect of substrate orientation and film thickness on the microstructure and magnetic properties of Sr- ferrite films grown on (0001) and 1102) sapphire substrates by pulsed laser deposition (PLD). The films grown on (1102) sapphire displayed a presence of various magnetic phases, including SrFe₁₂O₁₉ Fe₂O₃ and Fe₃O₄. The single hexaferrite phase was obtained in GIXRD at 1 degree and 5 degree for the thicker film. The structure measurements showed that all films on (0001) sapphire were single-phase c- axis oriented hexaferrites. The highest in-plane coercive force of 2.5 kOe was detected for the thicker film grown on (1102) sapphire. These films exhibit the highest in-plane squareness. The saturation magnetization of the films on (0001) sapphire rose when the film thickness was reduced.

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Mihaela E. Koleva, Rumen I. Tomov, S. Zotova, Peter A. Atanasov, Carmen Ristoscu, V. D. Nelea, Simona Arens, Eniko Gyorgy, Ion N. Mihailescu, and Silviu Colis "Influence of substrate orientation on the characteristics of Sr-ferrite thin films obtained by pulsed laser deposition", Proc. SPIE 4397, 11th International School on Quantum Electronics: Laser Physics and Applications, (9 April 2001); https://doi.org/10.1117/12.425155

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