Moire interferometry using stuck foil-embossed diffraction grating

Jaroslav Vaclavik; Jiri Minster; Roman Houha

doi:10.1117/12.445585

3 October 2001 Moire interferometry using stuck foil-embossed diffraction grating

Jaroslav Vaclavik, Jiri Minster, Roman Houha

Proceedings Volume 4399, Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering; (2001) https://doi.org/10.1117/12.445585
Event: Lasers in Metrology and Art Conservation, 2001, Munich, Germany

Abstract

The replacement of the standard replication technique by gluing the pre-embossed foil grating for the use in moire interferometry is the concern of the article. The manufacturing of the pre-embossed foil diffraction grating is explained. Relations of the influence of the specimen surface profile to the zero interference field are derived. Some measurements of the profile of glued grating are shown including calculated extraneous interference field. Example of moire interferogram is shown using glued foil grating.

Citation Download Citation

Jaroslav Vaclavik, Jiri Minster, and Roman Houha "Moire interferometry using stuck foil-embossed diffraction grating", Proc. SPIE 4399, Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering, (3 October 2001); https://doi.org/10.1117/12.445585

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