Advances in color measurement

David L. Battle; Harry J. Oana; Coleman F. Shannon

doi:10.1117/12.464610

6 June 2002 Advances in color measurement

David L. Battle, Harry J. Oana, Coleman F. Shannon

Proceedings Volume 4421, 9th Congress of the International Colour Association; (2002) https://doi.org/10.1117/12.464610
Event: 9th Congress of the International Color Association, 2001, Rochester, NY, United States

Abstract

A high-performance, dual-beam spectral analyzer, the SP- 2000, has been developed based on active-pixel complementary-metal-oxide-semiconductor (CMOS) technology. Each of the two diode arrays contain 256 pixels. The small size of the analyzer allows it to be used in portable spectrophotometers. A wavelength range from 360 to 780 nm has been achieved with a wavelength resolution of 1.8 nm and a signal-to-noise ratio of 85 dB. Wavelength calibration is done separately from the instrument using eight narrow-band spectral lines. Fiber optics are used to connect the spectral analyzer with an integrating sphere so that areas as small as 3 mm can be accurately measured.

Citation Download Citation

David L. Battle, Harry J. Oana, and Coleman F. Shannon "Advances in color measurement", Proc. SPIE 4421, 9th Congress of the International Colour Association, (6 June 2002); https://doi.org/10.1117/12.464610

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available