Paper
23 April 2001 Determination of energy spectrum of laser-created heavy ions from their implantation depth profile in a metallic substrate
Josef Krasa, Leos Laska, Karel Rohlena, Vratislav Perina, Vladimir Hnatowicz
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Proceedings Volume 4424, ECLIM 2000: 26th European Conference on Laser Interaction with Matter; (2001) https://doi.org/10.1117/12.425553
Event: 26th European Conference on Laser Interaction with Matter (ECLIM 2000), 2000, Prague, Czech Republic
Abstract
The energy spectrum of heavy ions emitted from laser- produced plasmas was determined by the use of a technique relying on the implantation of plasma ions into a substrate located close to the plasma. Ion energy spectra were reconstructed from depth profiles of the implanted ions measured by standard Rutherford back-scattering technique employing 2 MeV alpha particles scattered at 170 degrees laboratory angle. The energy spectra of Ag, Au, and Pb ions, implanted into aluminium or steel foils, are presented. A review of another techniques for ion energy spectrum measurement is presented and their limitations are compared.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Josef Krasa, Leos Laska, Karel Rohlena, Vratislav Perina, and Vladimir Hnatowicz "Determination of energy spectrum of laser-created heavy ions from their implantation depth profile in a metallic substrate", Proc. SPIE 4424, ECLIM 2000: 26th European Conference on Laser Interaction with Matter, (23 April 2001); https://doi.org/10.1117/12.425553
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KEYWORDS
Ions

Plasmas

Aluminum

Silver

Particles

Gold

Microchannel plates

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