PROCEEDINGS VOLUME 4468
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 29 JULY - 3 AUGUST 2001
Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing
Editor(s): Emile J. Knystautas, Wiley P. Kirk, Valerie Browning
Editor Affiliations +
IN THIS VOLUME

2 Sessions, 19 Papers, 0 Presentations, 0 Posters
Section  (17)
Proceedings Volume 4468 is from: Logo
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
29 July - 3 August 2001
San Diego, CA, United States
Section
John Baglin, Charles Rettner, Bruce D. Terris, D. K. Weller, J.-U. Thiele, Andrew Kellock, Simone Anders, T. Thomson
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452551
Craig A. Grimes, R. S. Singh, Elizabeth Dickey, Oomman Varghese
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452555
David B. Fenner, Vincent DiFilippo, Johnathan Bennett, Thomas Tetreault, James K. Hirvonen, Leonard C. Feldman
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452556
Pietro Baeri, Andrea Marco Malvezzi, Riccardo Reitano
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452557
Thomas Schenkel, A Kraemer, Ka-Ngo Leung, Alex V. Hamza, Joe W. McDonald, Dieter H. Schneider
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452558
Clara Rivero, Patricia S. Sharek, Gero Nootz, Cedric Lopez, Kathleen A. Richardson, Alfons Schulte, Richard Irwin, Tigran V. Galstian, Vincent Hamel, et al.
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452559
Boris I. Constantinov, Sergiu Sircu
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452560
Charles H. Koch, Matthew R. Augustine, Harris L. Marcus
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452561
Liudvikas Pranevicius, Julius Dudonis, Claude Templier, Jean-Paul Riviere
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452543
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452544
Aline Leon, Emile J. Knystautas, Jacques Huot, Robert Schulz
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452545
Patrick Fournet, Brendan McCarthy, Alan Brian Dalton, Jonathan N. Coleman, Robert J. Murphy, Christophe Stephan, Serge Lefrant, Patrick Bernier, Hugh James Byrne, et al.
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452546
Rhett Brewer, Paul N. Arendt, James R. Groves, Harry A. Atwater
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452547
Raj Kumar, Mukesh Kumar, P. J. George, K. S. Chari, Subroto Mukherjee
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452548
Shen-Chuan Lo, Fu-Rong Chen, Ji-Jung Kai, Li-Chien Chen, Li Chang, Cheng-Cheng Chiang, Peijun Ding, Barry Chin, Fusen E. Chen
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452549
Mojtaba Joodaki, Teoman Senyildiz, Guenter Kompa, Rainer Kassing, Hartmut Hillmer
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452550
Shawn Goedeke, Stephen W. Allison, R. H. Farahi, Slobodan Rajic, Panos G. Datskos
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452552
Poster Session
Akira Mori, Sinichi Iwasa, Kaoru Suzuki
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452553
Jeffrey B. Mecham, Kristi L. Cooper, Keith Huie, Richard O. Claus
Proceedings Volume Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing, (2001) https://doi.org/10.1117/12.452554
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