Paper
24 February 2003 Analysis of a chemical method to increase extreme ultraviolet microchannel-plate quantum efficiency
Richelieu Hemphill, Jerry Edelstein
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Abstract
Physical surface changes due to a wet chemical method to increase the extreme ultraviolet (EUV) quantum detection efficiency (QDE) of microchannel plate (MCP) detectors is examined. We show evidence that enhanced channel surface roughness and the creation of a low density surface layer combine to increase the secondary electron emission coefficient, which inturn, increases the quantum detection efficiency of the input MCP. The use of the wet chemical method to enhance the MCP EUV QDE by five different space flight programs is also discussed.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richelieu Hemphill and Jerry Edelstein "Analysis of a chemical method to increase extreme ultraviolet microchannel-plate quantum efficiency", Proc. SPIE 4854, Future EUV/UV and Visible Space Astrophysics Missions and Instrumentation, (24 February 2003); https://doi.org/10.1117/12.459778
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KEYWORDS
Microchannel plates

Quantum efficiency

Sensors

Extreme ultraviolet

Chemical analysis

Glasses

Surface roughness

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