Paper
27 May 2003 Shape measurement by endoscopes electronic-speckle-pattern interferometry with a two-wavelength method
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Proceedings Volume 4933, Speckle Metrology 2003; (2003) https://doi.org/10.1117/12.516622
Event: Speckle Metrology 2003, 2003, Trondheim, Norway
Abstract
Endoscopic Electronic-Speckle-Pattern Interferometry (endoscopic ESPI) is a tool for the detection and the measurement of displacements and movements in technical and biological cavities. For an adequate measurement accuracy additional to the geometry of imaging and illumination, information about the shape and curvature of the investigated cavities is required. Investigations to measure the surface topometry by endoscopic ESPI combined with a two-wavelength method have been carried out. The advantage of this arrangement, which uses commercial endoscope imaging systems, is that it is possible to obtain object shape and displacement data with the same endoscopic interferometric measurement system. Therefore, in a first step, the phase difference distribution effected by the change of the illumination wavelength and the object shape is detected by spatial phase shifting and in a second evaluation step, the radial distortions of the endoscope imaging system are corrected and the geometry of endoscopic off-axis illumination is taken into account by an approximation.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bjorn Kemper, Jochen Kandulla, Sabine Knoche, and Gert von Bally "Shape measurement by endoscopes electronic-speckle-pattern interferometry with a two-wavelength method", Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); https://doi.org/10.1117/12.516622
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KEYWORDS
Endoscopy

Endoscopes

Imaging systems

Interferometry

Metals

Phase shifting

3D image reconstruction

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