Thermal strain analysis for flip chip packaging

Zhao Wei Zhong; S. G. Lee

doi:10.1117/12.469030

25 March 2003 Thermal strain analysis for flip chip packaging

Zhao Wei Zhong, S. G. Lee

Author Affiliations +

Proceedings Volume 4945, MEMS/MOEMS: Advances in Photonic Communications, Sensing, Metrology, Packaging and Assembly; (2003) https://doi.org/10.1117/12.469030
Event: Photonics Fabrication Europe, 2002, Bruges, Belgium

Abstract

To have better understanding of the effects of using different epoxies as the encapsulation and/or underfill epoxies on the fatigue life of flip chip packages, finite element analysis was conducted. The finite element analysis software, ANSYS, was used to model flip chip packages with and without underfill and encapsulation and to run thermal testing simulations. The results revealed that the package with the longest fatigue life was the one with the underfill epoxy only. Packages with both underfill and encapsulation epoxies had shorter fatigue life, while packages with the encapsulation epoxy only had the shortest fatigue life. The use of the underfill epoxy with higher Young’s Modulus and lower viscosity and CTE reduces the thermal shear stress experienced by the solder joint, thus lengthening its fatigue life.

Citation Download Citation

Zhao Wei Zhong and S. G. Lee "Thermal strain analysis for flip chip packaging", Proc. SPIE 4945, MEMS/MOEMS: Advances in Photonic Communications, Sensing, Metrology, Packaging and Assembly, (25 March 2003); https://doi.org/10.1117/12.469030

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