Long-term reliability of high-power single-mode 980-nm pump laser diodes

Kejian Luo; Aland K. Chin; Zuntu Xu; Alan Nelson; Wei Gao

doi:10.1117/12.473282

19 June 2003 Long-term reliability of high-power single-mode 980-nm pump laser diodes

Kejian Luo, Aland K. Chin, Zuntu Xu, Alan Nelson, Wei Gao

Proceedings Volume 4993, High-Power Fiber and Semiconductor Lasers; (2003) https://doi.org/10.1117/12.473282
Event: Integrated Optoelectronics Devices, 2003, San Jose, CA, United States

Abstract

The long-term reliability of high-power, single-mode, 980 nm, InGaAs/GaAlAs/GaAs, laser diodes is reported. We have performed constant-current aging at at 85°C for three operating currents, 450 mA (~300 mW), 550 mA (~350 mW) and 700 mA (~420 mW). The data for 450 mA aging indicate a total failure rate of less than 250 FITs at a confidence level of 60%. For 550 mA and 700 mA operating currents, no degradation in laser performance within the 5% measurement accuracy of our test equipment have been observed during the first thousand hours of testing.

Citation Download Citation

Kejian Luo, Aland K. Chin, Zuntu Xu, Alan Nelson, and Wei Gao "Long-term reliability of high-power single-mode 980-nm pump laser diodes", Proc. SPIE 4993, High-Power Fiber and Semiconductor Lasers, (19 June 2003); https://doi.org/10.1117/12.473282

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