Moire interferometry applied to ferroelectric ceramics

Zhong Wei Liu; D. N. Fang; Huimin Xie; Q. D. Bing; S. Li; Fulong Dai

doi:10.1117/12.509794

29 April 2003 Moire interferometry applied to ferroelectric ceramics

Zhong Wei Liu, D. N. Fang, Huimin Xie, Q. D. Bing, S. Li, Fulong Dai

Proceedings Volume 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002; (2003) https://doi.org/10.1117/12.509794
Event: Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, 2002, Beijing, China

Abstract

This paper introduces how to in situ observe fracture behavior aroung a crack tip in ferroelectric ceramics under combined electromechancial loading by use of a moire interferometry technique. The deformation field induced by electric field and stress concentration near the crack tip in three-points bending experiments was measured. By analyzing the moire interferometry images it is found that under a constant mechanical load, an electical field has no effect on crack extension in the case that the directions of the poling, electric field and crack extension are perpendicular to each other. When the poling direction is parallel to the crack extension direction and perpendicular to the electric field, strain decreases faster than values predicted by the theoretical analysis as the distance away from the crack tip increases. In addition, as the electric field raises the strain near the crack tip increase, and the strain concentration phenomena becomes more significant.

Citation Download Citation

Zhong Wei Liu, D. N. Fang, Huimin Xie, Q. D. Bing, S. Li, and Fulong Dai "Moire interferometry applied to ferroelectric ceramics", Proc. SPIE 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, (29 April 2003); https://doi.org/10.1117/12.509794

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