Paper
16 October 2003 Image formation with a scatter-probe near-field optical microscope
Victor Ruiz-Cortes, Saul A. Zavala, Pedro Negrete-Regagnon, Eugenio R. Mendez, Hector M. Escamilla
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Abstract
Using a scanning near-field optical microscope with a metallic probe tip, we investigate the formation of near-field optical images. The scatter-probe is used only for converting an evanescent field to a propagating field and the detection system is in the far-field. This situation models the usual experimental set up employed in scatter-probe near-field microscopy. We study a 2D model of the scattering of s-polarized light, in which the object is illuminated by total internal reflection. The calculations of the scattered intensity at constant height were based on an integral equation, method of moments approach.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Victor Ruiz-Cortes, Saul A. Zavala, Pedro Negrete-Regagnon, Eugenio R. Mendez, and Hector M. Escamilla "Image formation with a scatter-probe near-field optical microscope", Proc. SPIE 5189, Surface Scattering and Diffraction III, (16 October 2003); https://doi.org/10.1117/12.507329
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KEYWORDS
Near field

Near field scanning optical microscopy

Near field optics

Optical microscopes

Scattering

Prisms

Dielectrics

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