Paper
4 December 2003 Apertureless near-field microscopy for chemical imaging of surfaces
Larissa Stebounova, Boris B. Akhremitchev, Gilbert C Walker
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Abstract
Technical developments and applications in infrared near-field microscopy for chemical imaging are discussed. A method to amplify the weak scattered signal in an apertureless microscope is demonstrated.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Larissa Stebounova, Boris B. Akhremitchev, and Gilbert C Walker "Apertureless near-field microscopy for chemical imaging of surfaces", Proc. SPIE 5223, Physical Chemistry of Interfaces and Nanomaterials II, (4 December 2003); https://doi.org/10.1117/12.511935
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KEYWORDS
Signal detection

Near field

Infrared radiation

Scattering

Near field scanning optical microscopy

Light scattering

Microscopy

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