Area-mura detection in TFT-LCD panel

Kyu N. Choi; Jae Y. Lee; Suk I. Yoo

doi:10.1117/12.525557

19 April 2004 Area-mura detection in TFT-LCD panel

Kyu N. Choi, Jae Y. Lee, Suk I. Yoo

Proceedings Volume 5300, Vision Geometry XII; (2004) https://doi.org/10.1117/12.525557
Event: Electronic Imaging 2004, 2004, San Jose, California, United States

Abstract

TFT-LCD generally has the intrinsic non-uniformity due to the variance of the backlight. The region that has the perceptible non-uniformity is defined as a defect, called area-mura. In this paper, we present a new segmentation method for detecting area-mura. We first extract candidates of area-muras using regression diagnostics and then select the real area-muras among those candidates based on the size and SEMU index, a measure of contrast based on human brightness perception. Performance of the presented method has been evaluated on those TFT-LCD panel samples provided by Samsung Electronics Co., Ltd.

Citation Download Citation

Kyu N. Choi, Jae Y. Lee, and Suk I. Yoo "Area-mura detection in TFT-LCD panel", Proc. SPIE 5300, Vision Geometry XII, (19 April 2004); https://doi.org/10.1117/12.525557

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