A new method to measure the signal quality for high-density recording systems

Eing-Seob Cho; Jae-Wook Lee; Junghyun Lee; Eun-Jin Ryu; Maxim Konakov; Jae-Seong Shim; Hyun-Soo Park

doi:10.1117/12.557115

9 September 2004 A new method to measure the signal quality for high-density recording systems

Eing-Seob Cho, Jae-Wook Lee, Junghyun Lee, Eun-Jin Ryu, Maxim Konakov, Jae-Seong Shim, Hyun-Soo Park

Author Affiliations +

Proceedings Volume 5380, Optical Data Storage 2004; (2004) https://doi.org/10.1117/12.557115
Event: Optical Data Storage Topical Meeting, 2004, Monterey, California, United States

Abstract

In this paper, a new method using an eye pattern is proposed to measure the signal quality for high-density recording systems. The experiment shows that the new method has a strong relation to SER of the system using PRML algorithm.

Citation Download Citation

Eing-Seob Cho, Jae-Wook Lee, Junghyun Lee, Eun-Jin Ryu, Maxim Konakov, Jae-Seong Shim, and Hyun-Soo Park "A new method to measure the signal quality for high-density recording systems", Proc. SPIE 5380, Optical Data Storage 2004, (9 September 2004); https://doi.org/10.1117/12.557115

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