Paper
20 December 1985 Detection Of Organic Impurities In Sulfur By Diffuse Reflectance Infrared Fourier Transform Spectroscopy (DRIFT)
Gary A. Totten, Anthony G. Severdia
Author Affiliations +
Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970762
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada
Abstract
Diffuse reflectance infrared Fourier transform spectroscopy (DRIFT) was used to qualitatively identify organic impurities in sulfur. The impurities were furthur graded by sorbing carbon disulfide (CS2), and measuring the area under the band from 1600 to 1500 cm-1 relative to the sulfur band at 1300 cm-1, as observed in the DRIFT spectrum. The sorption of CS2 was proportional to the amount of organic impurity, was not removed by vacuum at 70 C, and was reproducible whether sorption was by infusion or by exposure to vapor.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gary A. Totten and Anthony G. Severdia "Detection Of Organic Impurities In Sulfur By Diffuse Reflectance Infrared Fourier Transform Spectroscopy (DRIFT)", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); https://doi.org/10.1117/12.970762
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KEYWORDS
Sulfur

Infrared spectroscopy

Diffuse reflectance spectroscopy

FT-IR spectroscopy

Infrared radiation

Spectroscopy

Fourier spectroscopy

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