Accelerated Laser-Speckle Strain Gauge

Ichirou Yamaguchi; Takeo Furukawa; Toshitsugu Ueda; Eiji Ogita

doi:10.1117/12.949532

25 November 1985 Accelerated Laser-Speckle Strain Gauge

Ichirou Yamaguchi, Takeo Furukawa, Toshitsugu Ueda, Eiji Ogita

Proceedings Volume 0556, Intl Conf on Speckle; (1985) https://doi.org/10.1117/12.949532
Event: 29th Annual Technical Symposium, 1985, San Diego, United States

Abstract

An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser illuminated object is detected in real time using new photodetectors in place of linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning facility, produces a voltage directly proportional to speckle displacement. Therefore, this strain gauge, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few mV/microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of Hz and were able to evaluate their Poisson's ratios.

Citation Download Citation

Ichirou Yamaguchi, Takeo Furukawa, Toshitsugu Ueda, and Eiji Ogita "Accelerated Laser-Speckle Strain Gauge", Proc. SPIE 0556, Intl Conf on Speckle, (25 November 1985); https://doi.org/10.1117/12.949532

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