A differential active pixel sensor

Leonard MacEachern

doi:10.1117/12.582688

9 December 2004 A differential active pixel sensor

Leonard MacEachern

Proceedings Volume 5578, Photonics North 2004: Photonic Applications in Astronomy, Biomedicine, Imaging, Materials Processing, and Education; (2004) https://doi.org/10.1117/12.582688
Event: Photonics North, 2004, Ottawa, Ontario, Canada

Abstract

A differential active pixel sensor in present day CMOS technologies is described. The primary goal of the architecture is to reduce visible noise artifacts in the output image. Artifacts caused by gain mismatches among pixel elements, kTC noise, fixed-pattern noise due to reset mismatches, and corrupted pixels are considered. The architecture enables scan-based image processing on the image at high data rates while allowing the use of low speed (compared to conventional architectures) components.

Citation Download Citation

Leonard MacEachern "A differential active pixel sensor", Proc. SPIE 5578, Photonics North 2004: Photonic Applications in Astronomy, Biomedicine, Imaging, Materials Processing, and Education, (9 December 2004); https://doi.org/10.1117/12.582688

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