Paper
24 September 2004 Probes for a scanning near-field optical microscope on the base of tapered single-mode optical fiber
V. F. Dryakhlushin, Alexander Yurievich Klimov, Vladimir Rogov
Author Affiliations +
Proceedings Volume 5582, Advanced Optoelectronics and Lasers; (2004) https://doi.org/10.1117/12.583463
Event: 2003 Chapter books, 2003, Bellingham, WA, United States
Abstract
Probes for a scanning near-field optical microscope on the base of a single-mode adiabatically tapered optical fiber have been fabricated by the chemical etching only. The transmission coefficient of light in this probes is 2 - 3 orders magnitude higher than that of mechanically pulled fiber probes. The probe may be used for green (λ = 0.48 - 0.55 μm), red (0.60 - 0.68 μm) and near infrared (0.78 = 1.05 μm) wavelength ranges. The reason of this effect is explained. Probe of the scanning near-field optical microscope on the base of microstrip line is proposed. Review of optical near-field microscopy, surface structure diagnostics and surface modification with nanometer resolution are observed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. F. Dryakhlushin, Alexander Yurievich Klimov, and Vladimir Rogov "Probes for a scanning near-field optical microscope on the base of tapered single-mode optical fiber", Proc. SPIE 5582, Advanced Optoelectronics and Lasers, (24 September 2004); https://doi.org/10.1117/12.583463
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Near field scanning optical microscopy

Near field optics

Metals

Optical microscopes

Microscopes

Near field

Optical fibers

RELATED CONTENT


Back to Top