Electron-beam bunch length monitor based on electro-optic detection technique

Jingling Shen; Steven P. Jamison; Giel Berden

doi:10.1117/12.574262

28 January 2005 Electron-beam bunch length monitor based on electro-optic detection technique

Jingling Shen, Steven P. Jamison, Giel Berden

Proceedings Volume 5646, Nonlinear Optical Phenomena and Applications; (2005) https://doi.org/10.1117/12.574262
Event: Photonics Asia, 2004, Beijing, China

Abstract

We described an electro-optic detection technique-chirped-pulse cross correlation technique for measurement of an electron-beam bunch length. This is a high temporal resolution, single shot technique compared with the other two electro-optic detection techniques: the delay-scan method and the chirped-pulse spectrometer method. In delay-scan method temporal resolution is high, but measurement speed is not ideal. Although in the method of chirped-pulse spectrometer is single-shot with a high measurement speed, the temporal resolution is limited, which has been proved theoretically and experimentally. In chirped-pulse cross correlation technique, resolution and measurement speed are both satisfied. The technique is used to measure electron-beam bunch length in an accelerator.

Citation Download Citation

Jingling Shen, Steven P. Jamison, and Giel Berden "Electron-beam bunch length monitor based on electro-optic detection technique", Proc. SPIE 5646, Nonlinear Optical Phenomena and Applications, (28 January 2005); https://doi.org/10.1117/12.574262

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