Evaluation of outgassing contamination effects on optical surfaces of the LIL

Gaëlle F. Guehenneux; Marc Veillerot; Isabelle Tovena; Philippe R. Bouchut; Laurence Delrive

doi:10.1117/12.585229

21 February 2005 Evaluation of outgassing contamination effects on optical surfaces of the LIL

Gaëlle F. Guehenneux, Marc Veillerot, Isabelle Tovena, Philippe R. Bouchut, Laurence Delrive

Proceedings Volume 5647, Laser-Induced Damage in Optical Materials: 2004; (2005) https://doi.org/10.1117/12.585229
Event: Boulder Damage Symposium XXXVI, 2004, Boulder, Colorado, United States

Abstract

The Ligne d’Integration Laser (LIL) is a prototype installation at scale 1 of one of the 30 lasers of future Laser Mega Joule. It is intended to validate technological choices made for LMJ and to prepare its exploitation. The facility will contain nearly 10.000 optics and over 4000 m² of mirrors. Cleanliness will be an essential matter in the facility since contamination of optics can reduce their laser damage threshold. Hence, airborne molecular contamination (AMC) has been sampled near optics in strategic places of the LIL. These samplings have shown high levels of organic compounds, notably in the amplifying section, which is expected to be the most sensitive part in the LIL. Suspecting a local source of contamination, outgassing tests of typical materials constituting the amplifying section had been carried out. Among them, one sealing material has been identified as a source of organic contamination near the optics. Effects of this pollution have been investigated by a measurement of laser damage threshold after intentional contamination of optics. This work shows the complexity of the outgassing contamination issue, since several steps are necessary to evaluate the effects of this contamination on optical surfaces: air samplings, identification of sources, outgassing tests, intentional contamination of optics and finally measurement of laser damage threshold.

Citation Download Citation

Gaëlle F. Guehenneux, Marc Veillerot, Isabelle Tovena, Philippe R. Bouchut, and Laurence Delrive "Evaluation of outgassing contamination effects on optical surfaces of the LIL", Proc. SPIE 5647, Laser-Induced Damage in Optical Materials: 2004, (21 February 2005); https://doi.org/10.1117/12.585229

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