Paper
25 August 2005 Gaia astrometric CCDs and focal plane
Alexander Short, Gordon Hopkinson, Anouk Laborie, Pierre Pouny, Cyril Vetel, Tim Eaton, Roy Steward, Andrew Holland, Ian Hutchinson, David Smith, Jos de Bruijne, Philip Gare, Michael Perryman, Giuseppe Sarri, Igor Zayer
Author Affiliations +
Abstract
ESA's Gaia astrometry mission is due for launch in 2011. The astrometric instrument focal plane will have an area of up to 0.5m2 and will contain more than 100 CCDs. These will be operated in Time Delay and Integration mode in order to track and observe sources whilst the telescopes continuously scan the sky. Gaia's target for astrometric precision of a few millionths of an arc second, places extreme demands on focal plane thermo--mechanical stability and electronics performance. The CCDs themselves are large area, back illuminated, full--frame, four phase devices. They require maximum efficiency for observing the majority of (faint) objects, yet must simultaneously be able to handle very bright objects that will regularly cross the field of view. Achieving the final astrometric precision will also require excellent noise performance and MTF. In addition to demanding excellent performance from each CCD, they will need to be produced in large numbers which raises production and yield issues. When analyzing Gaia data it will be essential to understand and calibrate CCD behaviour correctly, including the expected performance degradation due to radiation damage. This is being addressed through comprehensive testing and the development of CCD models.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander Short, Gordon Hopkinson, Anouk Laborie, Pierre Pouny, Cyril Vetel, Tim Eaton, Roy Steward, Andrew Holland, Ian Hutchinson, David Smith, Jos de Bruijne, Philip Gare, Michael Perryman, Giuseppe Sarri, and Igor Zayer "Gaia astrometric CCDs and focal plane", Proc. SPIE 5902, Focal Plane Arrays for Space Telescopes II, 590205 (25 August 2005); https://doi.org/10.1117/12.616999
Lens.org Logo
CITATIONS
Cited by 11 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Charge-coupled devices

Electrons

Monte Carlo methods

Point spread functions

Calibration

Radiation effects

Data modeling

RELATED CONTENT


Back to Top