Temperature-dependent optical properties of Cd_0.96Zn_0.04Te substrate material

Manuel A. Quijada; Anne Marie Russell; Robert J. Hill

doi:10.1117/12.618734

18 August 2005 Temperature-dependent optical properties of Cd_0.96Zn_0.04Te substrate material

Manuel A. Quijada, Anne Marie Russell, Robert J. Hill

Proceedings Volume 5904, Cryogenic Optical Systems and Instruments XI; 59040Q (2005) https://doi.org/10.1117/12.618734
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

We report cryogenic optical properties of Cd_0.96Zn_0.04Te wafers that are used as substrate layers in the manufacturing of HgCdTe focal-plane array detectors. These studies are motivated by the fact that the substrate optical properties influence the overall detector performance. The studies consist of measuring the substrate frequency dependent transmittance T(ω) and reflectance R(ω) above and below the optical band-gap in the UV/Visible and infrared frequency ranges, and with temperature variation of the sample from 5 to 300 K. Analysis of these data shows the index of refraction n shows slight dispersion in the transparent 1-6 μm range of CdZnTe. Furthermore, n exhibits a weak reduction in the average value (~ 4%) when the sample temperature is reduced from 300 K to 5 K. These measurements also show that the optical gap near 1.49 eV at 300 K increases to 1.62 eV at 5 K. Finally, we observe sharp absorption peaks near this gap energy at low temperatures. The close proximity of these peaks to the optical transition threshold suggests that they originate from the creation of bound electron-hole pairs or excitons. The decay of these excitonic absorptions may contribute to a photoluminescence and transient background response of these back-illuminated HgCdTe CCD detectors.

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Manuel A. Quijada, Anne Marie Russell, and Robert J. Hill "Temperature-dependent optical properties of Cd_0.96Zn_0.04Te substrate material", Proc. SPIE 5904, Cryogenic Optical Systems and Instruments XI, 59040Q (18 August 2005); https://doi.org/10.1117/12.618734

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KEYWORDS

Reflectivity

Sensors

Optical properties

Mercury cadmium telluride

Transmittance

Zinc

Refractive index

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