Bragg and asymmetric-relief reflection gratings in As-S-Se thin films

Ilona Kuzmina; Janis Teteris

doi:10.1117/12.639187

13 June 2006 Bragg and asymmetric-relief reflection gratings in As-S-Se thin films

Ilona Kuzmina, Janis Teteris

Proceedings Volume 5946, Optical Materials and Applications; 59461G (2006) https://doi.org/10.1117/12.639187
Event: Optical Materials and Applications, 2005, Tartu, Estonia

Abstract

Bragg and asymmetric-relief gratings and their formation in the amorphous As-S-Se films are discussed. Due to the high refractive index and its photoinduced change, the films are useful in holography. The thickness of the As_0.4S_0.15Se_0.45 and As_0.4S_0.3Se_0.3 films used in the Bragg gratings is optimized. The dependence of the dimaction efficiency of the asymmetric-relief gratings on the conditions of recording, chemical treating, and reading out (polarization and angle) is studied.

Citation Download Citation

Ilona Kuzmina and Janis Teteris "Bragg and asymmetric-relief reflection gratings in As-S-Se thin films", Proc. SPIE 5946, Optical Materials and Applications, 59461G (13 June 2006); https://doi.org/10.1117/12.639187

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