Paper
14 December 2005 Diagnostic of wave dislocation obtained in light
Author Affiliations +
Proceedings Volume 5972, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II; 59720L (2005) https://doi.org/10.1117/12.639724
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II, 2004, Bucharest, Romania
Abstract
The feasibilities of using interferometric techques in the diagnostics of phase singularities and in the study of a phase structure of the field in their vicinity are demonstrated. The peculiar evolution of singularities into caustics produced by phase elements of singularity-generating objects of spherical and cylindrical shape are studied.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
O. V. Angelsky, A. P. Maksimyak, and P. P. Maksimyak "Diagnostic of wave dislocation obtained in light", Proc. SPIE 5972, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II, 59720L (14 December 2005); https://doi.org/10.1117/12.639724
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KEYWORDS
Interferometry

Diagnostics

Spherical lenses

Diffraction

Chemical elements

Computer simulations

Nanotechnology

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