High resolution surface plasmon interference resonance phase imaging

Qiang Lv; Xiuhua Yuan; Dexiu Huang

doi:10.1117/12.635974

6 December 2005 High resolution surface plasmon interference resonance phase imaging

Qiang Lv, Xiuhua Yuan, Dexiu Huang

Proceedings Volume 6020, Optoelectronic Materials and Devices for Optical Communications; 60203F (2005) https://doi.org/10.1117/12.635974
Event: Asia-Pacific Optical Communications, 2005, Shanghai, China

Abstract

A Surface Plasmon Resonance(SPR) sensor based on Kretschmann configuration has been setup. In this setup, Ag was applied as supporting metal, and incident angle was fixed. There are two main method, one is Surface Plasmon Microscopy(SPM) based on optical intensity, the other the Surface Plasmon Interference Microscopy (SPIM) based on the theory of Surface Plasmon Resonance and optical interference. SPM and SPIM were analyzed both theoretically and experimentally. Comparing and analyzing the result of theory and experiment, the result shows that SPIM has higher spatial resolution than SPM, and more powerful and immune to noise due to ambient light. So the SPIM is more fitful for sensor applications than SPM.

Citation Download Citation

Qiang Lv, Xiuhua Yuan, and Dexiu Huang "High resolution surface plasmon interference resonance phase imaging", Proc. SPIE 6020, Optoelectronic Materials and Devices for Optical Communications, 60203F (6 December 2005); https://doi.org/10.1117/12.635974

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