Paper
16 June 1986 Optical System Design For Automated Thermal Expansion Measurements
E. G. Wolff
Author Affiliations +
Proceedings Volume 0613, Nonlinear Optics and Applications; (1986) https://doi.org/10.1117/12.960414
Event: O-E/LASE'86 Symposium, 1986, Los Angeles, CA, United States
Abstract
Thermally induced distortions are of interest for many materials, components and structures used in astronomy, aerospace systems, metrology and the optics industry. Optical interference pattern analysis offers the best hope for precise information on dimensional changes of less than a micron. This paper reviews the various optical approaches to linear thermal expansion measurements. Emphasis is placed on the Michelson interferometer because of its versatility for making contactless measurements in real time and the elimination of sample shape or size constraints. The use of composite materials in optical support structures is a driving force in the utilization of improved optical systems for thermal distor-tion measurements. Auxiliary capabilities therefore include fast response, (e.g., for opto-acoustic emission analysis), long term stability (for creep effects), multi-dimensional changes (holography), automatic control of sample position and computer aided data acquisition and analysis.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. G. Wolff "Optical System Design For Automated Thermal Expansion Measurements", Proc. SPIE 0613, Nonlinear Optics and Applications, (16 June 1986); https://doi.org/10.1117/12.960414
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KEYWORDS
Signal processing

Composites

Interferometers

Mirrors

Temperature metrology

Michelson interferometers

Interferometry

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