Paper
28 February 2007 Automated segmentation of alloy microstructures in serial section images
Author Affiliations +
Proceedings Volume 6498, Computational Imaging V; 64980E (2007) https://doi.org/10.1117/12.715185
Event: Electronic Imaging 2007, 2007, San Jose, CA, United States
Abstract
This paper describes the application of the expectation-maximization/maximization of the posterior marginals (EM/MPM) algorithm to serial section images, which inherently represent three dimensional (3D) data. The images of interest are electron micrographs of cross sections of a titanium alloy. To improve the accuracy of the resulting segmentation images, the images are pre-filtered before being used as input to the EM/MPM algorithm. The output of the pre-filter at a particular pixel represents an estimate of the entropy at that pixel, based on the grayscale values of neighboring pixels. This filter tends to be biased towards higher entropy values if an edge is present within the window being used. This causes edges in the final segmentation to move out from higher entropy regions and into lower entropy regions. In order to preserve the locations of these edges, a multiscale technique involving the use of an adaptive filter window has been developed. We present experimental results demonstrating the application of this technique.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joel M. Dumke and Mary L. Comer "Automated segmentation of alloy microstructures in serial section images", Proc. SPIE 6498, Computational Imaging V, 64980E (28 February 2007); https://doi.org/10.1117/12.715185
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Image segmentation

Expectation maximization algorithms

Digital filtering

Image processing algorithms and systems

3D image processing

Photomicroscopy

Statistical analysis

Back to Top