Novel measurement method for selective laser sintering transient temperature field

Jian Xing; Jinghua Sun; Yiqing Gao

doi:10.1117/12.783652

27 November 2007 Novel measurement method for selective laser sintering transient temperature field

Jian Xing, Jinghua Sun, Yiqing Gao

Author Affiliations +

Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 67234N (2007) https://doi.org/10.1117/12.783652
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China

Abstract

In the course of selective laser sintering (SLS), transient temperature has directly effect on protyping mechanism and quality. According to the analysis of transient temperature, infrared thermograph test method is proposed in this paper. Point and line temperature is measured immediately, and the test result is compared with numerical simulation. The result indicates that the test agrees with theory, and the proposed method provides steady base for selecting sintering parameter reasonable.

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Jian Xing, Jinghua Sun, and Yiqing Gao "Novel measurement method for selective laser sintering transient temperature field", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67234N (27 November 2007); https://doi.org/10.1117/12.783652

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