Efficient calibration algorithm, and calibration pattern for correcting distortions for three-dimensional image acquisition systems for microscopic applications

Wojtek J. Walecki; Fanny Szondy

doi:10.1117/12.763917

12 February 2008 Efficient calibration algorithm, and calibration pattern for correcting distortions for three-dimensional image acquisition systems for microscopic applications

Wojtek J. Walecki, Fanny Szondy

Author Affiliations +

Proceedings Volume 6861, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV; 68610S (2008) https://doi.org/10.1117/12.763917
Event: SPIE BiOS, 2008, San Jose, California, United States

Abstract

We present novel method for fully automated detection of calibration features. It reduces computation effort when compared to traditional corner, edge, and conic detection algorithms. Our method employs generalized method based on properties of prospective projection invariants [1], but is also applicable for the optical systems suffering high order, non-spherical distortions. We also show an example when in presence of significant barrel distortion procedure developed for ideal pinhole camera system outlined in [1] does not converge to unique solution. We suggest new modified algorithm which produces unique solution.

Citation Download Citation

Wojtek J. Walecki and Fanny Szondy "Efficient calibration algorithm, and calibration pattern for correcting distortions for three-dimensional image acquisition systems for microscopic applications", Proc. SPIE 6861, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV, 68610S (12 February 2008); https://doi.org/10.1117/12.763917

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