Paper
11 March 2008 Electrical properties of radiation detector based on polycrystalline mercuric iodide (HgI2) thick film
Weimin Shi, Yaoming Zheng, Yuying Guo, Yu Zhang, Huan Xu, Linjun Wang, Yiben Xia
Author Affiliations +
Proceedings Volume 6984, Sixth International Conference on Thin Film Physics and Applications; 69843L (2008) https://doi.org/10.1117/12.792201
Event: Sixth International Conference on Thin Film Physics and Applications, 2007, Shanghai, China
Abstract
Potentially low cost and large area polycrystalline mercuric Iodide (HgI2) is one of the preferred materials for the fabrication of room temperature X-ray and gamma-ray detectors. In this paper, the technique of fabricating polycrystalline HgI2 detectors was studied and the energy resolution of 13.1% for 5.5 MeV 241Am α particles at room temperature was obtained for the first time. The optimal choice of particle injecting from negative interface enhances the collection efficiency.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Weimin Shi, Yaoming Zheng, Yuying Guo, Yu Zhang, Huan Xu, Linjun Wang, and Yiben Xia "Electrical properties of radiation detector based on polycrystalline mercuric iodide (HgI2) thick film", Proc. SPIE 6984, Sixth International Conference on Thin Film Physics and Applications, 69843L (11 March 2008); https://doi.org/10.1117/12.792201
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Cited by 4 scholarly publications.
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KEYWORDS
Sensors

Particles

Interfaces

X-rays

Electrodes

Capacitance

X-ray detectors

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