Silicon phototransistor reliability assessment and new selection strategies for space applications

Piero Spezzigu; Laurent Bechou; Gianandrea Quadri; Olivier Gilard; Yannick Deshayes; Yves Ousten; Massimo Vanzi

doi:10.1117/12.780976

26 April 2008 Silicon phototransistor reliability assessment and new selection strategies for space applications

Piero Spezzigu, Laurent Bechou, Gianandrea Quadri, Olivier Gilard, Yannick Deshayes, Yves Ousten, Massimo Vanzi

Proceedings Volume 7003, Optical Sensors 2008; 70030O (2008) https://doi.org/10.1117/12.780976
Event: SPIE Photonics Europe, 2008, Strasbourg, France

Abstract

The reliability of bipolar silicon-based phototransistors was investigated through evaluation tests for space applications. First of all a preliminary evaluation program including thermal cycling, vibrations and shocks test, radiation test and high-temperature operating life test was carried out to assess the overall quality of these phototransistors. During life test abnormal fluctuations of phototransistors collector current measured under constant illumination have been observed. In order to solve this problem, a failure analysis was conducted. Mobile charges located in the photobase passivation layer were found to be at the origin of these fluctuations. Based on these results a new methodology for device selection was proposed to achieve, despite to that issue, high reliability in operating conditions.

Citation Download Citation

Piero Spezzigu, Laurent Bechou, Gianandrea Quadri, Olivier Gilard, Yannick Deshayes, Yves Ousten, and Massimo Vanzi "Silicon phototransistor reliability assessment and new selection strategies for space applications", Proc. SPIE 7003, Optical Sensors 2008, 70030O (26 April 2008); https://doi.org/10.1117/12.780976

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