Advanced methods in scanning x-ray microscopy

A. Menzel; M. Dierolf; C. M. Kewish; P. Thibault; K. Jefimovs; C. David; M. Bech; T. H. Jensen; R. Feidenhans'l; A.-M. Heegaard; R. Hansen; T. Berthing; K. L. Martinez; J. Als-Nielsen; S. Kapishnikov; L. Leiserowitz; F. Pfeiffer; O. Bunk

doi:10.1117/12.821823

22 May 2009 Advanced methods in scanning x-ray microscopy

A. Menzel, M. Dierolf, C. M. Kewish, P. Thibault, K. Jefimovs, C. David, M. Bech, T. H. Jensen, R. Feidenhans'l, A.-M. Heegaard, R. Hansen, T. Berthing, K. L. Martinez, J. Als-Nielsen, S. Kapishnikov, L. Leiserowitz, F. Pfeiffer, O. Bunk

Author Affiliations +

Proceedings Volume 7378, Scanning Microscopy 2009; 73780O (2009) https://doi.org/10.1117/12.821823
Event: SPIE Scanning Microscopy, 2009, Monterey, California, United States

Abstract

New developments in X-ray instrumentation and analysis have facilitated the development and improvement of various scanning X-ray microscopy techniques. In this contribution, we offer an overview of recent scanning hard X-ray microscopy measurements performed at the Swiss Light Source. We discuss scanning transmission X-ray microscopy in its transmission, phase contrast, and dark-field imaging modalities. We demonstrate how small-angle X-ray scattering analysis techniques can be used to yield additional information. If the illumination is coherent, coherent diffraction imaging techniques can be brought to bear. We discuss how, from scanning microscopy measurements, detailed measurements of the X-ray scattering distributions can be used to extract high-resolution images. These microscopy techniques with their respective imaging power can easily be combined to multimodal X-ray microscopy.

Citation Download Citation

A. Menzel, M. Dierolf, C. M. Kewish, P. Thibault, K. Jefimovs, C. David, M. Bech, T. H. Jensen, R. Feidenhans'l, A.-M. Heegaard, R. Hansen, T. Berthing, K. L. Martinez, J. Als-Nielsen, S. Kapishnikov, L. Leiserowitz, F. Pfeiffer, and O. Bunk "Advanced methods in scanning x-ray microscopy", Proc. SPIE 7378, Scanning Microscopy 2009, 73780O (22 May 2009); https://doi.org/10.1117/12.821823

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available