Methods for TEM analysis of NIST's single-walled carbon nanotube Standard Reference Material

Elisabeth Mansfield; Roy Geiss; Jeffrey A. Fagan

doi:10.1117/12.825406

21 August 2009 Methods for TEM analysis of NIST's single-walled carbon nanotube Standard Reference Material

Elisabeth Mansfield, Roy Geiss, Jeffrey A. Fagan

Proceedings Volume 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III; 74050A (2009) https://doi.org/10.1117/12.825406
Event: SPIE NanoScience + Engineering, 2009, San Diego, California, United States

Abstract

The National Institute of Standards and Technology (NIST) will soon release a series of single-walled carbon nanotube (SWCNT) reference materials (RMs) to provide users with a well-characterized material for their applications. The SWCNT reference material will be introduced as a series of three types of material: (1) raw soot characterized for composition, which will be certified as a Standard Reference Material, (2) purified (greater than 90 % SWCNT by weight) bucky paper and (3) dispersed, length-sorted populations characterized by length. The instrumental characterization of NIST's SWCNT reference materials is extensive, and this paper aims to provide researchers with dispersion preparation methods for TEM (transmission electron microscopy) analysis of the SWCNT raw soot. A selection of dispersing solvents, including organic solvents, aqueous surfactants and DNA dispersions, were prepared and examined by TEM. Recommendations for sample preparation of the SWCNT SRM 2483 to yield images similar to those presented here are given. Examples of images of the length-sorted SWCNT reference material are also shown. These results illustrate the importance of optimal dispersion to enable imaging of SWCNT characteristics.

Citation Download Citation

Elisabeth Mansfield, Roy Geiss, and Jeffrey A. Fagan "Methods for TEM analysis of NIST's single-walled carbon nanotube Standard Reference Material", Proc. SPIE 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III, 74050A (21 August 2009); https://doi.org/10.1117/12.825406

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available