Paper
14 April 2010 Metrology CT technology and its applications in the precision engineering industry
Gerhard Schick
Author Affiliations +
Proceedings Volume 7522, Fourth International Conference on Experimental Mechanics; 75223S (2010) https://doi.org/10.1117/12.851634
Event: Fourth International Conference on Experimental Mechanics, 2009, Singapore, Singapore
Abstract
X-ray computed tomography (CT) provides a fast and powerful method to extract the geometrical features of complex parts. CT reconstructs an object from X-ray projection images and has long been used for qualitative investigation of internal structures in industrial applications. Recently, cone-beam CT has been adapted to the task of high-precision dimensional metrology of machined parts, providing a method of rapidly acquiring comprehensive and quantitative data on parts of arbitrary complexity. High-power micro-focus X-ray tubes, large-size flat panel X-ray detectors, very accurate linear and rotary drives and a high-performance reconstruction solution are combined to image and measure a wide spectrum of parts manufactured from polymer and metal alloys according to established metrology standards. Various calibration techniques are used at the several stages of the measurement process to e.g. characterize the behavior of X-ray tube and detector and precisely define the imaging geometry. To verify the measurement accuracy, suitable objects such as geometrical elements are calibrated according to international standards and then measured using the CT. CT can then be used as an accurate tool for non-destructive testing (such as porosity analysis and assembly checks), reverse engineering, nominal-actual comparisons and dimensional metrology of industrial precision parts.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gerhard Schick "Metrology CT technology and its applications in the precision engineering industry", Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 75223S (14 April 2010); https://doi.org/10.1117/12.851634
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications and 2 patents.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
X-rays

Metrology

Sensors

X-ray imaging

3D metrology

X-ray detectors

Calibration

Back to Top