Understanding a reference-free impedance method using collocated piezoelectric transducers

Eun Jin Kim; Min Koo Kim; Hoon Sohn; Hyun Woo Park

doi:10.1117/12.847474

8 April 2010 Understanding a reference-free impedance method using collocated piezoelectric transducers

Eun Jin Kim, Min Koo Kim, Hoon Sohn, Hyun Woo Park

Proceedings Volume 7650, Health Monitoring of Structural and Biological Systems 2010; 76502R (2010) https://doi.org/10.1117/12.847474
Event: SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring, 2010, San Diego, California, United States

Abstract

A new concept of a reference-free impedance method, which does not require direct comparison with a baseline impedance signal, is proposed for damage detection in a plate-like structure. A single pair of piezoelectric (PZT) wafers collocated on both surfaces of a plate are utilized for extracting electro-mechanical signatures (EMS) associated with mode conversion due to damage. A numerical simulation is conducted to investigate the EMS of collocated PZT wafers in the frequency domain at the presence of damage through spectral element analysis. Then, the EMS due to mode conversion induced by damage are extracted using the signal decomposition technique based on the polarization characteristics of the collocated PZT wafers. The effects of the size and the location of damage on the decomposed EMS are investigated as well. Finally, the applicability of the decomposed EMS to the reference-free damage diagnosis is discussed.

Citation Download Citation

Eun Jin Kim, Min Koo Kim, Hoon Sohn, and Hyun Woo Park "Understanding a reference-free impedance method using collocated piezoelectric transducers", Proc. SPIE 7650, Health Monitoring of Structural and Biological Systems 2010, 76502R (8 April 2010); https://doi.org/10.1117/12.847474

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