Paper
29 July 2010 Measuring the EUV and optical transmission of optical blocking layer for x-ray CCD camera
Takayoshi Kohmura, Kohei Kawai, Tatsuo Watanabe, Taiki Ogawa, Shoma Ikeda, Kaoru Ushiyama, Kenta Kaneko, Shunji Kitamoto, Hiroshi Murakami, Eri Takenaka, Kenta Nagasaki, Keiichi Higashi, Masaki Yoshida, Hiroshi Tsunemi, Kiyoshi Hayashida, Naohisa Anabuki, Hiroshi Nakajima, Rui Sakaguchi, Kazuo Shigeyama, Shutaro Ueda, Takeshi Go Tsuru, Tadayasu Dotani, Masanobu Ozaki, Aya Bamba, Junko S. Hiraga, Koji Mori
Author Affiliations +
Abstract
We have developed a new back-illuminated (BI) CCD which has an Optical Blocking Layer (OBL) directly coating its X-ray illumination surface with Aluminum-Polyimide-Aluminum instead of Optical Blocking Filter (OBF). OBL is composed of a thin polyimide layer sandwiched by two Al layers. Polyimide and Al has a capability to cut EUV and optical light, respectively. The X-ray CCD is affected by large doses of extreme ultraviolet (EUV) radiation from Earth sun-lit atmosphere (airglow) in orbit as well as the optical light. In order to evaluate the performance of the EUV-attenuating polyimide of the OBL, we measured the EUV transmission of both the OBL and the OBF at energies between 15-72 eV by utilizing a beam line located at the Photon Factory in High Energy Accelerator Research Organization (KEK-PF). We obtained the EUV transmission to be 3% at 41 eV which is the same as the expected transmission from the designed thickness of the polyimide layer. We also found no significant change of the EUV transmission of polyimide over the nine month interval spanned by out two experiments. We also measured the optical transmission of the OBL at wavelengths between 500-900Å to evaluate the performance of the Al that attenuates optical light, and found the optical transmission to be less than 4×10-5.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takayoshi Kohmura, Kohei Kawai, Tatsuo Watanabe, Taiki Ogawa, Shoma Ikeda, Kaoru Ushiyama, Kenta Kaneko, Shunji Kitamoto, Hiroshi Murakami, Eri Takenaka, Kenta Nagasaki, Keiichi Higashi, Masaki Yoshida, Hiroshi Tsunemi, Kiyoshi Hayashida, Naohisa Anabuki, Hiroshi Nakajima, Rui Sakaguchi, Kazuo Shigeyama, Shutaro Ueda, Takeshi Go Tsuru, Tadayasu Dotani, Masanobu Ozaki, Aya Bamba, Junko S. Hiraga, and Koji Mori "Measuring the EUV and optical transmission of optical blocking layer for x-ray CCD camera", Proc. SPIE 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray, 77323D (29 July 2010); https://doi.org/10.1117/12.856767
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Cited by 2 scholarly publications.
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KEYWORDS
Extreme ultraviolet

Aluminum

Charge-coupled devices

Transmittance

X-ray optics

X-rays

EUV optics

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