Data-constrained microstructure modeling with multi-spectrum x-ray CT

Y. S. Yang; A. M. Tulloh; T. Muster; A. Trinchi; S. C. Mayo; S. W. Wilkins

doi:10.1117/12.861964

1 September 2010 Data-constrained microstructure modeling with multi-spectrum x-ray CT

Y. S. Yang, A. M. Tulloh, T. Muster, A. Trinchi, S. C. Mayo, S. W. Wilkins

Proceedings Volume 7804, Developments in X-Ray Tomography VII; 78040N (2010) https://doi.org/10.1117/12.861964
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

Conventional X-ray CT is not usually sufficient to determine microscopic compositional distributions. A dataconstrained microstructure modeling (DCM) methodology has been developed which uses multiple CT data sets acquired with different X-ray spectra, and incorporates them as model constraints. The DCM approach has been applied to predict the distributions of corrosion inhibitor and filler in a polymer matrix. The DCM-predicted compositional microstructures have a reasonable agreement with EDX images taken on the sample surface.

Citation Download Citation

Y. S. Yang, A. M. Tulloh, T. Muster, A. Trinchi, S. C. Mayo, and S. W. Wilkins "Data-constrained microstructure modeling with multi-spectrum x-ray CT", Proc. SPIE 7804, Developments in X-Ray Tomography VII, 78040N (1 September 2010); https://doi.org/10.1117/12.861964

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