Hemispherical Directional Ellipsoidal Infrared Spectro Reflectometer

John T. Neu; Richard S. Dummer; Orlo E. Myers

doi:10.1117/12.941453

10 September 1987 Hemispherical Directional Ellipsoidal Infrared Spectro Reflectometer

John T. Neu, Richard S. Dummer, Orlo E. Myers

Proceedings Volume 0807, Passive Infrared Systems and Technology; (1987) https://doi.org/10.1117/12.941453
Event: Fourth International Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, The Hague, Netherlands

Abstract

There are specialized requirements for surface optical properties in a variety of fields. Activities in space especially have stimulated interest in these properties and led to development of refined instrumentation. One of the most commonly required optical properties is directional reflectance. The design and performance of a hemi-ellipsoidal spectroreflectometer to measure this property is the subject of this paper.

Citation Download Citation

John T. Neu, Richard S. Dummer, and Orlo E. Myers "Hemispherical Directional Ellipsoidal Infrared Spectro Reflectometer", Proc. SPIE 0807, Passive Infrared Systems and Technology, (10 September 1987); https://doi.org/10.1117/12.941453

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